| |   | SETTEC(22)000164r18 | CR TS 102 241 R18 Toolkit Test Events | Accepted | SET TEC | CR |
| | | SETTEC(22)000171r11 | CR 102 241 R17 Introduction of MLI | Accepted | SET TEC | CR |
| | | SETTEC(22)000168r3 | CR 102 241 R17 Clarification related to EVENT_EXTERNAL_FILE_UPDATE when the event is triggered by the SET DATA | Available (Postponed) | G+D MS | CR |
| | | SETTEC(22)000227 | CR 102 223 Refresh command eUICC Profile State change | Noted | NXP Semiconductors Netherlands | CR |
| | | SETTEC(22)000171r10 | CR TS 102 241 Introduction of MLI | Revised | SET TEC | CR |
| | | SETTEC(22)000171r9 | CR TS 102 241 Introduction of MLI | Revised | SET TEC | CR |
| | | SETTEC(22)000171r8 | CR TS 102 241 Introduction of MLI | Revised | SET TEC | CR |
| | | SETTEC(22)000171r7 | CR TS 102 241 Introduction of MLI | Revised | SET TEC | CR |
| | | SETTEC(22)000171r6 | CR TS 102 241 Introduction of MLI | Revised | SET TEC | CR |
| | | SETTEC(22)000171r5 | CR TS 102 241 Introduction of MLI | Revised | SET TEC | CR |
| | | SETTEC(22)000171r4 | CR TS 102 241 Introduction of MLI | Revised | SET TEC | CR |
| | | SETTEC(22)000164r17 | CR TS 102 241 R18 Toolkit Test Events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000163r16 | CR TS 102 221 R18 Test Configuration State for Test events | Accepted | SET TEC | CR |
| | | SETTEC(22)000164r16 | CR TS 102 241 R18 Toolkit Test Events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000163r15 | CR TS 102 221 R18 Test Configuration State for Test events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000183r3 | CR TS 103 666-1 R15 Remove usage of ANY DEFINED BY from ASN.1 in Metadatum | Accepted | SET TEC | CR |
| | | SETTEC(22)000164r15 | CR TS 102 241 R18 Toolkit Test Events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000163r14 | CR TS 102 221 R18 Test Configuration State for Test events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000171r3 | CR TS 102 241 Introduction of MLI | Revised | SET TEC | CR |
| | | SETTEC(22)000164r14 | CR TS 102 241 R18 Toolkit Test Events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000163r13 | CR TS 102 221 R18 Test Configuration State for Test events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000183r2 | CR TS 103 666-1 R15 Remove usage of ANY DEFINED BY from ASN.1 in Metadatum | Revised | IDEMIA | CR |
| | | SETTEC(22)000183r1 | CR TS 103 666-1 R15 Remove usage of ANY DEFINED BY from ASN.1 in Metadatum | Revised | IDEMIA | CR |
| | | SETTEC(22)000164r13 | CR TS 102 241 R18 Toolkit Test Events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000163r12 | CR TS 102 221 R18 Test Configuration State for Test events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000164r12 | CR TS 102 241 R18 Toolkit Test Events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000168r2 | CR 102 241 R17 Clarification related to EVENT_EXTERNAL_FILE_UPDATE when the event is triggered by the SET DATA | Revised | G+D MS Germany GmbH | CR |
| | | SETTEC(22)000164r11 | CR TS 102 241 R18 Toolkit Test Events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000163r11 | CR TS 102 221 R18 TestSpecificOperatingMode TestConfiguration | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000204r1 | Report of SET TEC #100 | Accepted | Chair | Report |
| | | SETTEC(22)000224r1 | LS to 3GPP CT WG6 on alignment of ETSI and 3GPP specifications | Accepted | SET TEC | LSout |
| | | SETTEC(22)000226r1 | CR 102 241 R17 New values 'Reserved by 3GPP' in the definition of events | Accepted | SET TEC | CR |
| | | SETTEC(22)000211r1 | CR 102 226 R18 Correction of reference to NIST SP 800-38B | Accepted | SET TEC | CR |
| | | SETTEC(22)000219r1 | CR 101 220 R17 Addition of abbreviations | Accepted | SET TEC | CR |
| | | SETTEC(22)000220r1 | CR 102 223 R17 Correction of incorrect command names | Accepted | SET TEC | CR |
| | | SETTEC(22)000221r1 | CR_102 221 R18 Curvature clarification | Noted | IDEMIA | CR |
| | | SETTEC(22)000226 | CR 102 241 R17 New values 'Reserved by 3GPP' in the definition of events | Revised | VALID SOLUCIONES TECNOLÓGICAS | CR |
| | | SETTEC(22)000225 | TS 102 223 Alignment of Command details from clause 8.6 with 3GPP settings | Noted | Comprion GmbH | CR |
| | | SETTEC(22)000224 | LS to 3GPP CT WG6 on alignment of ETSI and 3GPP specifications | Revised | Comprion GmbH | LSout |
| | | SETTEC(22)000205r1 | Agenda for SET TEC #101 | Accepted | Chair | Agenda |
| | | SETTEC(22)000164r10 | CR TS 102 241 R18 Toolkit Test Events | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000163r10 | CR TS 102 221 R18 TestSpecificOperatingMode TestConfiguration | Revised | Qualcomm Technologies Int | CR |
| | | SETTEC(22)000223 | New values 'Reserved by 3GPP' to allocate in TS 102 241 Clause 6.2 Table 1 for new 3GPP event download | Noted | 3GPP CT 6 | LSin |
| | | SETTEC(22)000222 | New values allocated in 'Reserved by 3GPP' range to be reported in TS 102.223 Clause 8.6 PROVIDE LOCAL INFORMATION | Noted | 3GPP CT 6 | LSin |
| | | SETTEC(22)000221 | CR_102 221 R18 Curvature clarification | Revised | IDEMIA | CR |
| | | SETTEC(22)000220 | TS 102 223 Correction of incorrect command names | Revised | Comprion GmbH | CR |
| | | SETTEC(22)000219 | CR 101 220 R17 Addition of abbreviations | Revised | Rapporteur | CR |
| | | SETTEC(22)000181r2 | CR TS 103 666-1 R15 Remove usage of ANY DEFINED BY from ASN.1 in SSPCapability for SspClass | Accepted | SET TEC | CR |
| | | SETTEC(22)000171r2 | pCR TS 102 241 Draft Introduction of MLI | Revised | SET TEC | CR |
| | | SETTEC(22)000200r1 | Meeting schedule after SET TEC #100 | Noted | Chair | Other |