| | SCPTEST(17)054018 | CR 102 230-1, Creation of Rel-14 | Accepted | Comprion GmbH | CR |
| | SCPTEST(17)054017 | Clarification on the test configuration for a device which provides sufficient power to the UICC when switched off. | Noted | STMicroelectronics | Other |
| | SCPTEST(17)054016r1 | WI on IoT device related issues | Accepted | Comprion GmbH | Other |
| | SCPTEST(17)054016 | WI on IoT device related issues | Revised | Comprion GmbH | Other |
| | SCPTEST(17)054015r1 | CR 102 230-1: Modification of tests applicability to test Terminals supporting one Voltage Class only | Accepted | Comprion GmbH | CR |
| | SCPTEST(17)054015 | CR 102 230-1: Modification of tests applicability to test Terminals supporting one Voltage Class only | Revised | Comprion GmbH | CR |
| | SCPTEST(17)054014r2 | CR 102 694-2 :Addition of new test case on Extended resume by slave time | Accepted | SCP TEST | CR |
| | SCPTEST(17)054014r1 | CR 102 694-2 :Addition of new test case on Extended resume by slave time | Revised | NXP Semiconductors Netherlands | CR |
| | SCPTEST(17)054014 | CR 102 694-2 :Addition of new test case on Extended resume by slave time | Revised | NXP Semiconductors Netherlands | CR |
| | SCPTEST(17)054013r5 | CR 102 694-1 : Development of test cases for RQ11 of the SWP interface states management | Accepted | SCP TEST | CR |
| | SCPTEST(17)054013r4 | CR 102 694-1 : Development of test cases for RQ11 of the SWP interface states management | Revised | NXP Semiconductors Netherlands | CR |
| | SCPTEST(17)054013r3 | CR 102 694-1 : Development of test cases for RQ11 of the SWP interface states management | Revised | NXP Semiconductors Netherlands | CR |
| | SCPTEST(17)054013r2 | CR 102 694-1 : Development of test cases for RQ11 of the SWP interface states management | Revised | NXP Semiconductors Netherlands | CR |
| | SCPTEST(17)054013r1 | CR 102 694-1 : Development of test cases for RQ11 of the SWP interface states management | Revised | NXP Semiconductors Netherlands | CR |
| | SCPTEST(17)054013 | CR 102 694-1 : Development of test cases for RQ11 of the SWP interface states management | Revised | NXP Semiconductors Netherlands | CR |
| | SCPTEST(17)054012r3 | CR 102 230-1: Creation of Rel-14 and adding new tests for UICC Suspension Mechanism | Accepted | SCP TEST | CR |
| | SCPTEST(17)054012r2 | CR 102 230-1: Creation of Rel-14 and adding new tests for UICC Suspension Mechanism | Revised | Comprion GmbH | CR |
| | SCPTEST(17)054012r1 | CR 102 230-1: Creation of Rel-14 and adding new tests for UICC Suspension Mechanism | Revised | Comprion GmbH | CR |
| | SCPTEST(17)054012 | CR 102 230-1: Creation of Rel-14 and adding new tests for UICC Suspension Mechanism | Revised | Comprion GmbH | CR |
| | SCPTEST(17)054011r1 | CR 102 695-3: Creation of TS 102 695-3 REL-13 | Accepted | Comprion GmbH | CR |
| | SCPTEST(17)054011 | CR 102 695-3: Creation of TS 102 695-3 REL-13 | Revised | Comprion GmbH | CR |
| | SCPTEST(17)054010r1 | CR 102 695-1: Creation of TS 102 695-1 REL-13 | Accepted | Comprion GmbH | CR |
| | SCPTEST(17)054010 | CR 102 695-1: Creation of TS 102 695-1 REL-13 | Revised | Comprion GmbH | CR |
| | SCPTEST(17)054009 | CR 102 230-1: Correction of SW '6282' after SEARCH RECORD in Test Case 7.2.5 | Withdrawn | Comprion GmbH | CR |
| | SCPTEST(17)054008r1 | CR 102 230-1: Clarification on UICC Presence Detection Test Case | Accepted | Comprion GmbH | CR |
| | SCPTEST(17)054008 | CR 102 230-1: Clarification on UICC Presence Detection Test Case | Revised | Comprion GmbH | CR |
| | SCPTEST(17)054007r1 | CR 102 384: Creation of TS 102 384 REL-12 | Accepted | Comprion GmbH | CR |
| | SCPTEST(17)054007 | CR 102 384: Creation of TS 102 384 REL-12 | Revised | Comprion GmbH | CR |
| | SCPTEST(17)054006r1 | CR 102 384: Rel-10 content replacement by reference to TS 102 384 Rel-11 | Accepted | Comprion GmbH | CR |
| | SCPTEST(17)054006 | CR 102 384: Rel-10 content replacement by reference to TS 102 384 Rel-11 | Revised | Comprion GmbH | CR |
| | SCPTEST(17)054005r1 | Meeting schedule | Noted | ETSI Secretariat | Other |
| | SCPTEST(17)054005 | Meeting schedule | Revised | ETSI Secretariat | Other |
| | SCPTEST(17)054004r1 | Action Item List SCP TEST (after the meeting) | Noted | WG/TG Chairman | Other |
| | SCPTEST(17)054004 | Action Item List SCP TEST (before the meeting) | Revised | WG/TG Chairman | Other |
| | SCPTEST(17)054003 | Report from ETSI TC SCP Plenary Meeting | Noted | WG/TG Chairman | Report |
| | SCPTEST(17)054002r1 | Allocation of documents ETSI TC SCP WG TEST #54 | Accepted | WG/TG Chairman | Agenda |
| | SCPTEST(17)054002 | Allocation of documents ETSI TC SCP WG TEST #54 | Revised | WG/TG Chairman | Agenda |
| | SCPTEST(17)054001 | Agenda for ETSI TC SCP WG TEST#54 | Accepted | WG/TG Chairman | Agenda |
| | SCPTEST(17)052008 | CR 102268: Introducing test for Contactless state event | Withdrawn | Comprion GmbH | CR |
| | SCPTEST(17)052007 | CR 102268: Update of the reference section | Withdrawn | Comprion GmbH | CR |
| | SCPTEST(16)050020 | CR 102 695-1: Addition of new test case on UI_STATE | Withdrawn | Comprion GmbH | CR |